Reliable substrate characterization in the broadband range of 220-1700 nm based 
on spectral photometric data

Amochkina, Tatiana; Matusevich, Vladislav; Trubetskov, Michael K.

doi:10.1117/12.3017217

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Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data

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Trubetskov, Michael K.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Amochkina, T., Matusevich, V., & Trubetskov, M. K. (2024). Reliable substrate characterization in the broadband range of 220-1700 nm based on spectral photometric data. In Advances in Optical Thin Films VIII. SPIE. doi:10.1117/12.3017217.

Cite as: https://hdl.handle.net/21.11116/0000-000F-DD14-2

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