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Review Article

A high frequency sensor for optical beam deflection atomic force microscopy

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Enning, R., Ziegler, D., Nievergelt, A. P., Friedlos, R., Venkataramani, K., & Stemmer, A. (2011). A high frequency sensor for optical beam deflection atomic force microscopy. Review of Scientific Instruments, 82(4): 043705. doi:10.1063/1.3575322.


Cite as: https://hdl.handle.net/21.11116/0000-0010-84FC-D
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