English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse
  1. View item / 
  2. Item Summary

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Phase determination in interference-based superresolving microscopes through critical frequency analysis

MPS-Authors
/persons/resource/persons15210

Hell,  S. W.
Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society;

/persons/resource/persons14847

Bewersdorf,  J.
Department of NanoBiophotonics, MPI for biophysical chemistry, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Hell, S. W., Blanca, C. M., & Bewersdorf, J. (2002). Phase determination in interference-based superresolving microscopes through critical frequency analysis. Optics Letters, 27(11), 888-890. Retrieved from http://www.opticsinfobase.org/viewmedia.cfm?uri=ol-27-11-888&seq=0.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0012-F396-D
Abstract
Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and (IM)-M-5 microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope's transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution. (C) 2002 Optical Society of America