Microstructured polymer tips for scanning near-field optical microscopy

Stuermer, H.; Koehler, J. M.; Jovin, T. M.

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Microstructured polymer tips for scanning near-field optical microscopy

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Jovin, T. M.
Max Planck Society;

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Stuermer, H., Koehler, J. M., & Jovin, T. M. (1998). Microstructured polymer tips for scanning near-field optical microscopy. Ultramicroscopy, 71, 107-110.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0012-FE21-C

Abstract

A new technique for producing polymeric cantilevers with integrated tips for combined scanning-force microscopy/scanning near-field optical microscopy is described in this paper. By integration reactive ion of etched polymeric and fluorescent tips to polymer-based cantilevers, it will become possible to produce apertureless sensors for a scanning near-field optical microscope with the well-known atomic-force distance control.