Alkali cluster films on insulating substrates - comparison between scanning 
force microscopy and extinction data

Balzer, F.; Jett, S. D.; Rubahn, H.-G.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Alkali cluster films on insulating substrates - comparison between scanning force microscopy and extinction data

MPS-Authors

/persons/resource/persons14807

Balzer, F.
Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society;

/persons/resource/persons15275

Jett, S. D.
Department of Molecular Biology, MPI for biophysical chemistry, Max Planck Society;

Rubahn, H.-G.
Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

237953.pdf
(Publisher version), 0B

Supplementary Material (public)

There is no public supplementary material available

Citation

Balzer, F., Jett, S. D., & Rubahn, H.-G. (1998). Alkali cluster films on insulating substrates - comparison between scanning force microscopy and extinction data. Chemical Physics Letters, 297, 273-280. Retrieved from http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TFN-3V8VF0R-K-2D&_cdi=5231&_user=38661&_pii=S0009261498011683&_orig=search&_coverDate=11%2F27%2F1998&_sk=997029996&view=c&wchp=dGLbVlb-zSkWA&md5=36cc5cebbdda2be984532789ee0e25db&ie=/sdarticle.pdf.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0012-FE2C-5

Abstract

Extinction spectra of alkali cluster films on mica substrates are recorded as a function of alkali metal deposition time. They are reproduced quantitatively by theoretical spectra of oblate spheroids, using cluster number density n, average cluster semi-axis [a] parallel to the mica surface, and mean ellipticity [R-perpendicular to] perpendicular to the surface obtained from scanning force microscopy images. It is found that reliable values of average cluster semi-axes can be obtained from optical spectra only by taking the distribution of perpendicular-plane ellipticities into account.