Double aberration correction in a low-energy electron microscope

Schmidt, Thomas; Marchetto, Helder; Lévesque, Pierre L.; Groh, Ulli; Maier, Florian; Preikszas, Dirk; Hartel, Peter; Spehr, Rainer; Lilienkamp, Gerhard; Engel, Wilfried; Fink, Rainer; Bauer, Ernst; Rose, Harald; Umbach, Eberhard; Freund, Hans-Joachim

doi:10.1016/j.ultramic.2010.07.007

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Double aberration correction in a low-energy electron microscope

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Schmidt, Thomas
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Marchetto, Helder
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Lévesque, Pierre L.
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Engel, Wilfried
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Freund, Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Schmidt, T., Marchetto, H., Lévesque, P. L., Groh, U., Maier, F., Preikszas, D., et al. (2010). Double aberration correction in a low-energy electron microscope. Ultramicroscopy, 110(11), 1358-1361. doi:10.1016/j.ultramic.2010.07.007.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-F6D7-5

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