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Journal Article

Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110)

MPS-Authors
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Heinke,  Lars
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Lichtenstein,  Leonid
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Simon,  Georg H.
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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König,  Thomas
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Citation

Heinke, L., Lichtenstein, L., Simon, G. H., König, T., Heyde, M., & Freund, H.-J. (2010). Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B, 82, 075430-1-075430-6. Retrieved from http://dx.doi.org/10.1103/PhysRevB.82.075430.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-F774-C
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