Properties of oxide thin films and their adsorption behavior studied by 
scanning tunneling microscopy and conductance spectroscopy

Nilius, Niklas

doi:10.1016/j.surfrep.2009.07.004

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Properties of oxide thin films and their adsorption behavior studied by scanning tunneling microscopy and conductance spectroscopy

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Nilius, Niklas
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Nilius, N. (2009). Properties of oxide thin films and their adsorption behavior studied by scanning tunneling microscopy and conductance spectroscopy. Surface Science Reports, 64(12), 595-659. doi:10.1016/j.surfrep.2009.07.004.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-FB24-F

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