Combined low-temperature scanning tunneling/atomic force microscope for atomic 
resolution imaging and site-specific force spectroscopy

Albers, Boris; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

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Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

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Heyde, Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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引用

Albers, B., Liebmann, M., Schwendemann, T. C., Baykara, M. Z., Heyde, M., Salmeron, M., Altman, E. I., & Schwarz, U. D. (2008). Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments, 79(3), 033704-1-033704-9. Retrieved from http://dx.doi.org/10.1063/1.2842631.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-FEFF-7

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