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Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

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Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Albers, B., Liebmann, M., Schwendemann, T. C., Baykara, M. Z., Heyde, M., Salmeron, M., et al. (2008). Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments, 79(3), 033704-1-033704-9. Retrieved from http://dx.doi.org/10.1063/1.2842631.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-FEFF-7
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