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Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor

MPS-Authors
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Rust,  Hans-Peter
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Citation

Rust, H.-P., Heyde, M., & Freund, H.-J. (2006). Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor. Review of Scientific Instruments, 77(04), 043710–1-043710–8. doi:10.1063/1.2194490.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0011-04BF-C
Abstract
Signal electronics equipped with a bandpass filter phase detector for noncontact atomic force microscopy (ncAFM) has been developed. A double quartz tuning fork assembly is used as a force sensor, where one fork serves as a dither tuning fork, while the other is used as a measuring tuning fork. An electrically conductive Pt90Ir10 tip enables the sensor to work in both scanning tunneling microscopy (STM) and AFM modes. Electronic circuits for self-oscillation control and for frequency detection are given in detail. Atomically resolved STM and ncAFM images of a thin alumina film on NiAl(110) are shown with the microscope cooled down to 4.5 K by liquid helium.