Probing adsorption sites on thin oxide films by dynamic force microscopy

Heyde, Markus; Simon, Georg H.; Rust, Hans-Peter; Freund, Hans-Joachim

doi:10.1063/1.2424432

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Probing adsorption sites on thin oxide films by dynamic force microscopy

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Heyde, Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Simon, Georg H.
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Rust, Hans-Peter
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund, Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Heyde, M., Simon, G. H., Rust, H.-P., & Freund, H.-J. (2006). Probing adsorption sites on thin oxide films by dynamic force microscopy. Applied Physics Letters, 89(26): 263107. doi:10.1063/1.2424432.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-069D-8

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