Atomic resolution on MgO(001) by atomic force microscopy using a double quartz 
tuning fork sensor at low-temperature and ultrahigh vacuum

Heyde, Markus; Sterrer, Martin; Rust, Hans-Peter; Freund, Hans-Joachim

doi:10.1063/1.2012523

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Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

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Heyde, Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Sterrer, Martin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Rust, Hans-Peter
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund, Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Citation

Heyde, M., Sterrer, M., Rust, H.-P., & Freund, H.-J. (2005). Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum. Applied Physics Letters, 87(08), 083104–1-083104–3. doi:10.1063/1.2012523.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-07D1-6

Abstract

Atomic resolution with a double quartz tuning fork sensor for low-temperature ultrahigh vacuum atomic force and scanning tunneling microscopy is presented. The new features of the force sensor assembly are discussed. Atomically resolved images of MgO on Ag(001) have been obtained. Images acquired in the attractive and the repulsive regimes controlled to a constant frequency shift are shown, revealing contrast changes.