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Journal Article

SiO2-supported Pt particles studied by electron microscopy

MPS-Authors
/persons/resource/persons22210

Wang,  Di
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22148

Su,  Dang Sheng
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons32804

Rupprechter,  Günther
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22071

Schlögl,  Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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8797_Mat_Chem_Phys_81_2003.pdf
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Citation

Wang, D., Penner, S., Su, D. S., Rupprechter, G., Hayek, K., & Schlögl, R. (2003). SiO2-supported Pt particles studied by electron microscopy. Materials Chemistry and Physics, 81(2-3), 341-344. doi:10.1016/S0254-0584(03)00017-8.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-11D7-B
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