A double lamellae dropoff etching procedure for tungsten tips attached to 
tuning fork atomic force microscopy/scanning tunneling microscopy sensors

Kulawik, Maria; Nowicki, Marek; Thielsch, Gero; Cramer, Ludger; Rust, Hans-Peter; Freund, Hans-Joachim; Pearl, Thomas P.; Weiss, Paul S.

doi:10.1063/1.1532833

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A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors

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Kulawik, Maria
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons248140

Nowicki, Marek
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22172

Thielsch, Gero
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons248142

Cramer, Ludger
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22034

Rust, Hans-Peter
Chemical Physics, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21524

Freund, Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Kulawik, M., Nowicki, M., Thielsch, G., Cramer, L., Rust, H.-P., Freund, H.-J., et al. (2003). A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors. Review of Scientific Instruments, 74(2), 1027-1030. doi:10.1063/1.1532833.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-126D-4

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