Probing interface electronic structure with overlayer quantum-well resonances: 
Al/Si(111)

Aballe, Lucia; Rogero, Celia; Kratzer, Peter; Gokhale, Shubha; Horn, Karsten

doi:10.1103/PhysRevLett.87.156801

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Probing interface electronic structure with overlayer quantum-well resonances: Al/Si(111)

MPS-Authors

/persons/resource/persons21287

Aballe, Lucia
Fritz Haber Institute, Max Planck Society;

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Rogero, Celia
Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21760

Kratzer, Peter
Theory, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21562

Gokhale, Shubha
Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21640

Horn, Karsten
Fritz Haber Institute, Max Planck Society;

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PRL-87-156801-2001.pdf
(全文テキスト（全般）), 418KB

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引用

Aballe, L., Rogero, C., Kratzer, P., Gokhale, S., & Horn, K. (2001). Probing interface electronic structure with overlayer quantum-well resonances: Al/Si(111). Physical Review Letters, 87(15):. doi:10.1103/PhysRevLett.87.156801.

引用: https://hdl.handle.net/11858/00-001M-0000-0011-197D-4

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