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TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition

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Roddatis,  Vladimir V.
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Su,  Dang Sheng
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Beckmann,  Erich
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Jentoft,  Friederike C.
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Fischer,  Armin
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Kröhnert,  Jutta
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Schlögl,  Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Citation

Roddatis, V. V., Su, D. S., Beckmann, E., Jentoft, F. C., Fischer, A., Kröhnert, J., et al. (2000). TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition. Poster presented at Autumn School on Materials Science and Electron Microscopy 2000, Berlin, Germany.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-1A92-A
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