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Charakterisierung chemisch abgeschiedener nanokristalliner Zirkonoxidfilme mit Rasterkraft- und Rasterelektronenmikroskopie (AFM & SEM)

MPS-Authors
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Fischer,  Armin
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Jentoft,  Friederike C.
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Weinberg,  Gisela
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Schlögl,  Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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fischer_bunsen_99.pdf
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Citation

Fischer, A., Jentoft, F. C., Weinberg, G., & Schlögl, R. (1999). Charakterisierung chemisch abgeschiedener nanokristalliner Zirkonoxidfilme mit Rasterkraft- und Rasterelektronenmikroskopie (AFM & SEM). Talk presented at 98. Hauptversammlung der Deutschen Bunsen-Gesellschaft für Physikalische Chemie. Dortmund, Germany. 1999-05-13 - 1999-05-15.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0011-1CD8-F
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