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Journal Article

Identifiaction of chalcogen defects in silicon

MPS-Authors

Beeler,  Franz
Max Planck Society;

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Scheffler,  Matthias
Theory, Fritz Haber Institute, Max Planck Society;

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Citation

Beeler, F., Scheffler, M., Jepsen, O., & Gunnarsson, O. (1985). Identifiaction of chalcogen defects in silicon. Microscopic Identification of Electronic Defects in Semiconductors, 46, 117.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0011-2352-2
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