A novel method for unambiguous ion identification in mixed ion beams extracted 
from an EBIT

Meissl, W.; Simon, M.; Crespo López-Urrutia, J. R.; Tawara, H.; Ullrich, J.; Winter, H.; Aumayr, F.

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A novel method for unambiguous ion identification in mixed ion beams extracted from an EBIT

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Simon, M.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Crespo López-Urrutia, J. R.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Tawara, H.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Ullrich, J.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Citation

Meissl, W., Simon, M., Crespo López-Urrutia, J. R., Tawara, H., Ullrich, J., Winter, H., et al. (2006). A novel method for unambiguous ion identification in mixed ion beams extracted from an EBIT. Review of Scientific Instruments, 77(9): 093303.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-7F0E-7

Abstract

A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an Electron Beam Ion Trap (EBIT) is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio.