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Electron-ion interactions for trapped highly charged Ge ions

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Crespo López-Urrutia,  J. R.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Zhang,  X.
Division Prof. Dr. Werner Hofmann, MPI for Nuclear Physics, Max Planck Society;

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Tawara,  H.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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引用

Machtoub, G. H., Crespo López-Urrutia, J. R., Zhang, X., & Tawara, H. (2006). Electron-ion interactions for trapped highly charged Ge ions. Canadian Journal of Physics, 84(1), 67-81.


引用: https://hdl.handle.net/11858/00-001M-0000-0011-86D9-A
要旨
A theoretical simulation of complex K X-ray spectra including those from dielectronic recombination and excitation processes is presented for trapped highly charged germanium ions ( Geq+, q = 27–30) interacting with a dense electron beam. We carried out numerical calculations of transition rates, level energies, transition wavelengths, resonance and collision strengths, and satellite intensity factors. Analytical results related to cross sections of B- through He-like Ge ions were obtained as well. The simulated spectra, including the contribution from different charge states of Ge27+–Ge30+, show good overall agreement over a wide electron energy range with the available X-ray measurements from the Heidelberg electron beam ion trap (EBIT). We have also predicted the electron impact excitation cross-section ratios for different transitions of Ge29+ and Ge30+ ions. It should be emphasized that the present analysis can also provide new information and clues of possible temperature measurements for EBIT and other plasma diagnostics.