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Conference Paper

Multiple ionization in strong fields

MPS-Authors
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Rudenko,  A.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Moshammer,  R.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Schröter,  C. D.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Zrost,  K.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Feuerstein,  B.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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de Jesus,  V. L. B.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Ullrich,  J.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Louvain_Ullrich.doc
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Citation

Rudenko, A., Moshammer, R., Schröter, C. D., Zrost, K., Feuerstein, B., de Jesus, V. L. B., et al. (2005). Multiple ionization in strong fields. In B. Piraux (Ed.), Electron and Photon Impact Ionization and Related Topics 2004. Proceedings of the International Conference. (pp. 93-102). Bristol and Philadelphia: Institute of Physics.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0011-89F0-5
Abstract
Single and multiple ionization of rare gas atoms by 25 and 7 fs intense laser pulses has been studied using a "Reaction Microscope”. For single ionization of He, Ne and Ar in the tunnelling regime, surprising and distinct patterns have been observed in high-resolution low-energy electron spectra. Mechanisms of double and multiple ionization were elucidated and partly identified via recoil-ion momentum distributions and correlated electron spectra. For Ne the highly correlated “instantaneous” emission of up to four electrons is triggered by a recollisional electron impact, whereas in multiple ionization of Ar different mechanisms involving field ionization steps and recollision-induced excitations play a major role.