Symmetry Detection Using Line Features

Bokeloh, Martin; Berner, Alexander; Wand, Michael; Seidel, Hans-Peter; Schilling, Andreas

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Symmetry Detection Using Line Features

MPS-Authors

/persons/resource/persons44158

Bokeloh, Martin
Computer Graphics, MPI for Informatics, Max Planck Society;
International Max Planck Research School, MPI for Informatics, Max Planck Society;

/persons/resource/persons44123

Berner, Alexander
Computer Graphics, MPI for Informatics, Max Planck Society;

/persons/resource/persons45695

Wand, Michael
Computer Graphics, MPI for Informatics, Max Planck Society;

/persons/resource/persons45449

Seidel, Hans-Peter
Computer Graphics, MPI for Informatics, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Bokeloh, M., Berner, A., Wand, M., Seidel, H.-P., & Schilling, A. (2009). Symmetry Detection Using Line Features. Computer Graphics Forum (Proc. Eurographics), 28(2), 697-706.

引用: https://hdl.handle.net/11858/00-001M-0000-000F-19E4-3

要旨

要旨はありません