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Polarization and Phase-shifting for 3D Scanning of Translucent Objects

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Chen,  Tongbo
Computer Graphics, MPI for Informatics, Max Planck Society;

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Lensch,  Hendrik P. A.
Computer Graphics, MPI for Informatics, Max Planck Society;

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Fuchs,  Christian
Computer Graphics, MPI for Informatics, Max Planck Society;

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Seidel,  Hans-Peter       
Computer Graphics, MPI for Informatics, Max Planck Society;

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引用

Chen, T., Lensch, H. P. A., Fuchs, C., & Seidel, H.-P. (2007). Polarization and Phase-shifting for 3D Scanning of Translucent Objects. In 2007 IEEE Conference on Computer Vision and Pattern Recognition, CVPR'07. - Vol. 4 (pp. 1829-1836). Piscataway, NJ, USA: IEEE.


引用: https://hdl.handle.net/11858/00-001M-0000-000F-2053-3
要旨
Translucent objects pose a difficult problem for traditional structured light 3D scanning techniques. Subsurface scattering corrupts the range estimation in two ways: by drastically reducing the signal-to-noise ratio and by shifting the intensity peak beneath the surface to a point which does not coincide with the point of incidence. In this paper we analyze and compare two descattering methods in order to obtain reliable 3D coordinates for translucent objects. By using polarization-difference imaging, subsurface scattering can be filtered out because multiple scattering randomizes the polarization direction of light while the surface reflectance partially keeps the polarization direction of the illumination. The descattered reflectance can be used for reliable 3D reconstruction using traditional optical 3D scanning techniques, such as structured light. Phase-shifting is another effective descattering technique if the frequency of the projected pattern is sufficiently high. We demonstrate the performance of these two techniques and the combination of them on scanning real-world translucent objects.