Artifact-free, long-lasting phase plate

Kurth, P.; Pattai, S.; Rudolph, D.; Overbuschmann, J.; Wamser, J.; Irsen, S.

doi:10.1017/S1431927614002827

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Artifact-free, long-lasting phase plate

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Rudolph, D.
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Overbuschmann, J.
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Irsen, S.
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Kurth, P., Pattai, S., Rudolph, D., Overbuschmann, J., Wamser, J., & Irsen, S. (2014). Artifact-free, long-lasting phase plate. Microscopy and Microanalysis, 20, 220-221. doi:10.1017/S1431927614002827.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-60B9-1

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