date: 2017-08-21T13:36:45Z
pdf:unmappedUnicodeCharsPerPage: 1
pdf:PDFVersion: 1.3
pdf:docinfo:title: The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
xmp:CreatorTool: pdftk 1.44 - www.pdftk.com
dc:description: EIGER is a single-photon-counting hybrid pixel detector developed at the Paul Scherrer Institut, Switzerland. It is designed for applications at synchrotron light sources with photon energies above 5 keV. Features of EIGER include a small pixel size (75 microm x 75 microm), a high frame rate (up to 23 kHz), a small dead-time between frames (down to 3 micros) and a dynamic range up to 32-bit. In this article, the use of EIGER as a detector for electrons in low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) is reported. It is demonstrated that, with only a minimal modification to the sensitive part of the detector, EIGER is able to detect electrons emitted or reflected by the sample and accelerated to 8-20 keV. The imaging capabilities are shown to be superior to the standard microchannel plate detector for these types of applications. This is due to the much higher signal-to-noise ratio, better homogeneity and improved dynamic range. In addition, the operation of the EIGER detector is not affected by radiation damage from electrons in the present energy range and guarantees more stable performance over time. To benchmark the detector capabilities, LEEM experiments are performed on selected surfaces and the magnetic and electronic properties of individual iron nanoparticles with sizes ranging from 8 to 22 nm are detected using the PEEM endstation at the Surface/Interface Microscopy (SIM) beamline of the Swiss Light Source.
access_permission:modify_annotations: true
access_permission:can_print_degraded: true
description: EIGER is a single-photon-counting hybrid pixel detector developed at the Paul Scherrer Institut, Switzerland. It is designed for applications at synchrotron light sources with photon energies above 5 keV. Features of EIGER include a small pixel size (75 microm x 75 microm), a high frame rate (up to 23 kHz), a small dead-time between frames (down to 3 micros) and a dynamic range up to 32-bit. In this article, the use of EIGER as a detector for electrons in low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) is reported. It is demonstrated that, with only a minimal modification to the sensitive part of the detector, EIGER is able to detect electrons emitted or reflected by the sample and accelerated to 8-20 keV. The imaging capabilities are shown to be superior to the standard microchannel plate detector for these types of applications. This is due to the much higher signal-to-noise ratio, better homogeneity and improved dynamic range. In addition, the operation of the EIGER detector is not affected by radiation damage from electrons in the present energy range and guarantees more stable performance over time. To benchmark the detector capabilities, LEEM experiments are performed on selected surfaces and the magnetic and electronic properties of individual iron nanoparticles with sizes ranging from 8 to 22 nm are detected using the PEEM endstation at the Surface/Interface Microscopy (SIM) beamline of the Swiss Light Source.
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dc:format: application/pdf; version=1.3
title: The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
Last-Save-Date: 2017-08-21T13:36:45Z
pdf:docinfo:creator_tool: pdftk 1.44 - www.pdftk.com
access_permission:fill_in_form: true
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meta:save-date: 2017-08-21T13:36:45Z
pdf:encrypted: false
dc:title: The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
modified: 2017-08-21T13:36:45Z
Content-Type: application/pdf
X-Parsed-By: org.apache.tika.parser.DefaultParser
meta:creation-date: 2017-08-09T12:00:00Z
created: 2017-08-09T12:00:00Z
access_permission:extract_for_accessibility: true
access_permission:assemble_document: true
xmpTPg:NPages: 12
Creation-Date: 2017-08-09T12:00:00Z
pdf:charsPerPage: 3240
access_permission:extract_content: true
access_permission:can_print: true
producer: International Union of Crystallography
access_permission:can_modify: true
pdf:docinfo:producer: International Union of Crystallography
pdf:docinfo:created: 2017-08-09T12:00:00Z