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Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials Physics, Montanuniversität Leoben, Austria;

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Abboud, A., Kirchlechner, C., Kečkéš, J., Çonka-Nurdan, T., Send, S., Micha, J.-S., et al. (2017). Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography, 50(3), 901-908. doi:10.1107/S1600576717005581.


Cite as: https://hdl.handle.net/21.11116/0000-0001-6EE3-4
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