Modeling RF-induced power deposition and temperature rise of coaxial leads with 
helical wires

Kozlov, Mikhail; Horner, Marc; Kainz, Wolfgang

doi:10.1109/EMBC.2019.8856572

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Conference Paper

Modeling RF-induced power deposition and temperature rise of coaxial leads with helical wires

MPS-Authors

/persons/resource/persons19793

Kozlov, Mikhail
Department Neurophysics (Weiskopf), MPI for Human Cognitive and Brain Sciences, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Kozlov, M., Horner, M., & Kainz, W. (2019). Modeling RF-induced power deposition and temperature rise of coaxial leads with helical wires. In Proceedings of the 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) 2019 (pp. 1895-1898). doi:10.1109/EMBC.2019.8856572.

Cite as: https://hdl.handle.net/21.11116/0000-0004-D21B-1

Abstract

The lead electromagnetic model (LEM) and the radiofrequency responses, i.e., the net dissipated electrode power and net temperature increase, above background, at the electrodes, were modelled for two coax-type insulated leads with inner and outer helical wires with a pitch of 0.35 mm. The quotient of the variances of the fitted LEM values and observed values (R 2 ) of the radiofrequency responses was substantially different for the lead electrode versus the ring electrode, where R 2 of the ring quotient was a function of the duration of the RF-induced heating.