Detection of trace impurities and other defects in functional nanomaterials

Lim, Joohyun; Kim, Se-Ho; Sahu, Rajib; Aymerich Armengol, Raquel; Kasian, Olga; Choi, Pyuck-Pa; Stephenson, Leigh; Gault, Baptiste; Scheu, Christina

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Detection of trace impurities and other defects in functional nanomaterials

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Lim, Joohyun
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kim, Se-Ho
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sahu, Rajib
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Aymerich Armengol, Raquel
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kasian, Olga
Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stephenson, Leigh
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault, Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu, Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Lim, J., Kim, S.-H., Sahu, R., Aymerich Armengol, R., Kasian, O., Choi, P.-P., et al. (2019). Detection of trace impurities and other defects in functional nanomaterials. Talk presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019. Düsseldorf, Germany. 2019-10-27 - 2019-10-30.

Cite as: https://hdl.handle.net/21.11116/0000-0005-469D-C

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