date: 2020-10-19T15:28:02Z
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pdf:docinfo:title: An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser
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dc:description: An improved analysis for single-particle imaging (SPI) experiments, using the limited data, is presented here. Results are based on a study of bacteriophage PR772 performed at the Atomic, Molecular and Optical Science instrument at the Linac Coherent Light Source as part of the SPI initiative. Existing methods were modified to cope with the shortcomings of the experimental data: inaccessibility of information from half of the detector and a small fraction of single hits. The general SPI analysis workflow was upgraded with the expectation-maximization based classification of diffraction patterns and mode decomposition on the final virus-structure determination step. The presented processing pipeline allowed us to determine the 3D structure of bacteriophage PR772 without symmetry constraints with a spatial resolution of 6.9?nm. The obtained resolution was limited by the scattering intensity during the experiment and the relatively small number of single hits.
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description: An improved analysis for single-particle imaging (SPI) experiments, using the limited data, is presented here. Results are based on a study of bacteriophage PR772 performed at the Atomic, Molecular and Optical Science instrument at the Linac Coherent Light Source as part of the SPI initiative. Existing methods were modified to cope with the shortcomings of the experimental data: inaccessibility of information from half of the detector and a small fraction of single hits. The general SPI analysis workflow was upgraded with the expectation-maximization based classification of diffraction patterns and mode decomposition on the final virus-structure determination step. The presented processing pipeline allowed us to determine the 3D structure of bacteriophage PR772 without symmetry constraints with a spatial resolution of 6.9?nm. The obtained resolution was limited by the scattering intensity during the experiment and the relatively small number of single hits.
dcterms:created: 2020-10-15T12:00:00Z
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title: An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser
Last-Save-Date: 2020-10-19T15:28:02Z
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dc:title: An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser
modified: 2020-10-19T15:28:02Z
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producer: International Union of Crystallography
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pdf:docinfo:producer: International Union of Crystallography
pdf:docinfo:created: 2020-10-15T12:00:00Z