English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  DetailsSummary

Released
Journal Article

Universal compressive characterization of quantum dynamics

MPS-Authors

Leuchs,  Gerd
Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;

Sanchez-Soto,  Luis L.
Quantumness, Tomography, Entanglement, and Codes, Emeritus Group Leuchs, Emeritus Groups, Max Planck Institute for the Science of Light, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)

2005.13776.pdf
(Preprint), 3MB

Supplementary Material (public)
There is no public supplementary material available
Citation

Kim, Y., Teo, Y. S., Ahn, D., Im, D.-G., Cho, Y.-W., Leuchs, G., et al. (2020). Universal compressive characterization of quantum dynamics. Physical Review Letters, 124(21): 210401. doi:10.1103/PhysRevLett.124.210401.


Cite as: https://hdl.handle.net/21.11116/0000-0008-12B6-6
Abstract
Recent quantum technologies utilize complex multidimensional processes that
govern the dynamics of quantum systems. We develop an adaptive
diagonal-element-probing compression technique that feasibly characterizes any
unknown quantum processes using much fewer measurements compared to
conventional methods. This technique utilizes compressive projective
measurements that are generalizable to arbitrary number of subsystems. Both
numerical analysis and experimental results with unitary gates demonstrate low
measurement costs, of order O(d^2) for d-dimensional systems, and
robustness against statistical noise. Our work potentially paves the way for a
reliable and highly compressive characterization of general quantum devices.