date: 2019-11-07T09:03:56Z
pdf:PDFVersion: 1.6
pdf:docinfo:title: Lock-in thermography for analyzing solar cells and failure analysis in other electronic components
xmp:CreatorTool: Arbortext Advanced Print Publisher 11.0.3433/W Unicode
access_permission:can_print_degraded: true
subject: Quantitative InfraRed Thermography Journal, 2019. doi:10.1080/17686733.2018.1563349
language: English
dc:format: application/pdf; version=1.6
pdf:docinfo:creator_tool: Arbortext Advanced Print Publisher 11.0.3433/W Unicode
access_permission:fill_in_form: true
pdf:encrypted: false
dc:title: Lock-in thermography for analyzing solar cells and failure analysis in other electronic components
modified: 2019-11-07T09:03:56Z
cp:subject: Quantitative InfraRed Thermography Journal, 2019. doi:10.1080/17686733.2018.1563349
pdf:docinfo:subject: Quantitative InfraRed Thermography Journal, 2019. doi:10.1080/17686733.2018.1563349
pdf:docinfo:creator: Otwin Breitenstein
meta:author: Steffen Sturm
meta:creation-date: 2019-11-07T09:03:12Z
created: 2019-11-07T09:03:12Z
access_permission:extract_for_accessibility: true
Creation-Date: 2019-11-07T09:03:12Z
Author: Steffen Sturm
producer: Acrobat Distiller 8.1.0 (Windows)
pdf:docinfo:producer: Acrobat Distiller 8.1.0 (Windows)
pdf:unmappedUnicodeCharsPerPage: 0
dc:description: Quantitative InfraRed Thermography Journal, 2019. doi:10.1080/17686733.2018.1563349
Keywords: Lock-in thermography; electronic devices; failure analysis
access_permission:modify_annotations: true
dc:creator: Steffen Sturm
description: Quantitative InfraRed Thermography Journal, 2019. doi:10.1080/17686733.2018.1563349
dcterms:created: 2019-11-07T09:03:12Z
Last-Modified: 2019-11-07T09:03:56Z
dcterms:modified: 2019-11-07T09:03:56Z
title: Lock-in thermography for analyzing solar cells and failure analysis in other electronic components
xmpMM:DocumentID: uuid:d20a4307-579d-45ba-a6e9-f25b5334b838
Last-Save-Date: 2019-11-07T09:03:56Z
pdf:docinfo:keywords: Lock-in thermography; electronic devices; failure analysis
pdf:docinfo:modified: 2019-11-07T09:03:56Z
meta:save-date: 2019-11-07T09:03:56Z
Content-Type: application/pdf
X-Parsed-By: org.apache.tika.parser.DefaultParser
creator: Steffen Sturm
dc:language: English
dc:subject: Lock-in thermography; electronic devices; failure analysis
access_permission:assemble_document: true
xmpTPg:NPages: 16
pdf:charsPerPage: 982
access_permission:extract_content: true
access_permission:can_print: true
meta:keyword: Lock-in thermography; electronic devices; failure analysis
access_permission:can_modify: true
pdf:docinfo:created: 2019-11-07T09:03:12Z