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Surface melting of Al(110) studied by surface extended X-ray absorption fine structure

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Polcik,  Martin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Wilde,  Lutz
Fritz Haber Institute, Max Planck Society;

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Haase,  J.
Fritz Haber Institute, Max Planck Society;

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Citation

Polcik, M., Wilde, L., & Haase, J. (1998). Surface melting of Al(110) studied by surface extended X-ray absorption fine structure. Surface Science, 405(1), 112-120. doi:10.1016/S0039-6028(98)00059-4.


Cite as: https://hdl.handle.net/21.11116/0000-0008-B503-8
Abstract
Surface extended X-ray absorption fine structure (SEXAFS) measurements were used to study the surface melting of Al(110). The measurements were performed between 100 K and the bulk melting temperature Tm on Al(110) as well as on the reference system Al(111) which does not show surface melting. Based on a cumulant-expansion analysis of the SEXAFS data, surface melting of Al(110) was observed via an anisotropy of the Debye–Waller factor. This anisotropy can be explained by a residual order of the quasi-liquid which consists of intact rows or segments of them moving with liquid-like mobilities. The measurements also yield an Einstein temperature of 317 K and allow us to determine a linear thermal expansion coefficient of (2.7±0.5)×10−5 K−1.