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キーワード:
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要旨:
We present absolute throughput analysis of several crystals for the
Orion High-REsolution X-ray (OHREX) imaging crystal spectrometer using
ray tracing and experimental measurements. The OHREX spectrometer is a
high-resolution x-ray spectrometer designed to measure spectral line
shapes at the Orion laser facility. The spectrometer is fielded with up
to two spherical crystals simultaneously covering two independent
spectral ranges. Each crystal has a nominal radius of curvature of R =
67.2 cm and is fielded at a nominal Bragg angle of 51.3 degrees. To
cover different bands of interest, several different crystals are
available, including Ge (111), KAP, and several cuts of quartz, whose
resolving power lambda/Delta lambda exceeds 10 000. The calibrated
response of the available crystals has previously been reported from
measurements at the EBIT-I electron beam ion trap at Lawrence Livermore
National Laboratory. Here, we model the absolute throughput of each
crystal using ray tracing and verify the results using experimental data
for the quartz (10 (1) over bar1) crystal.
