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Crystallographic dependence of the spin Hall angle in epitaxial Pt films: Comparison of optical and electrical detection of spin-torque ferromagnetic resonance techniques

MPG-Autoren
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Grover,  Bharat
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Hazra,  Binoy Krishna
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Ma,  Tianping
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;
International Max Planck Research School for Science and Technology of Nano-Systems, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Pal,  Banabir
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Srivastava,  Abhay Kant
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;
International Max Planck Research School for Science and Technology of Nano-Systems, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Choudhury,  Samiran
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Woltersdorf,  Georg
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Parkin,  Stuart S. P.
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

Externe Ressourcen

https://doi.org/10.1063/5.0085818
(Verlagsversion)

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5.0085818.pdf
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Zitation

Grover, B., Hazra, B. K., Ma, T., Pal, B., Bernstein, N., Rothschild, A., et al. (2022). Crystallographic dependence of the spin Hall angle in epitaxial Pt films: Comparison of optical and electrical detection of spin-torque ferromagnetic resonance techniques. Applied Physics Letters, 120(17): 172406. doi:10.1063/5.0085818.


Zitierlink: https://hdl.handle.net/21.11116/0000-000A-9092-D
Zusammenfassung
The spin Hall effect appears in nature in two forms. Its intrinsic form is highly dependent on the crystal symmetry while its extrinsic form stems from impurity scattering. Its efficiency is defined by the spin Hall angle, θSH, and has profound impact on spintronic technologies. However, an accurate measurement of θSH is not straightforward nor the identification of its origin. In this work, we apply a spin-torque driven ferromagnetic resonance method that is probed in two different ways, optically and electrically, to study the dependence of θSH in the crystallographic direction in epitaxial Al2O3/Pt (111), MgO(110)/Pt (110), and MgO(001)/Pt (001) films. We show that the electrical technique is limited in its ability to accurately quantify θSH at high current densities, and in some cases, it may even result in erroneous θSH values. Such cases include films that exhibit a large inhomogeneous broadening. We find that θSH is strongly affected by the crystallographic direction. Our study extends the understanding of one of the most commonly used methods for the exploration of the spin Hall effect.