date: 2023-05-25T12:11:23Z
pdf:PDFVersion: 1.7
pdf:docinfo:title: Ion microscopy with evolutionary-algorithm-based autofocusing
xmp:CreatorTool: IOPP
access_permission:can_print_degraded: true
subject: Engineering Research Express, 5(2023) 015015. doi:10.1088/2631-8695/acb419
crossmarkMajorVersionDate: 2023-01-30
dc:format: application/pdf; version=1.7
pdf:docinfo:custom:robots: noindex
pdf:docinfo:creator_tool: IOPP
access_permission:fill_in_form: true
pdf:encrypted: false
dc:title: Ion microscopy with evolutionary-algorithm-based autofocusing
modified: 2023-05-25T12:11:23Z
cp:subject: Engineering Research Express, 5(2023) 015015. doi:10.1088/2631-8695/acb419
pdf:docinfo:custom:CrossMarkDomains[1]: iop.org
robots: noindex
pdf:docinfo:subject: Engineering Research Express, 5(2023) 015015. doi:10.1088/2631-8695/acb419
pdf:docinfo:custom:crossmarkMajorVersionDate: 2023-01-30
meta:creation-date: 2023-01-26T02:31:42Z
created: 2023-01-26T02:31:42Z
access_permission:extract_for_accessibility: true
Creation-Date: 2023-01-26T02:31:42Z
pdf:docinfo:custom:doi: 10.1088/2631-8695/acb419
producer: iText® 5.5.13.3 ©2000-2022 iText Group NV (AGPL-version)
pdf:docinfo:producer: iText® 5.5.13.3 ©2000-2022 iText Group NV (AGPL-version)
doi: 10.1088/2631-8695/acb419
pdf:unmappedUnicodeCharsPerPage: 0
dc:description: Engineering Research Express, 5(2023) 015015. doi:10.1088/2631-8695/acb419
Keywords: strong-field ionization; ion microscopy; evolutionary algorithms
access_permission:modify_annotations: true
description: Engineering Research Express, 5(2023) 015015. doi:10.1088/2631-8695/acb419
dcterms:created: 2023-01-26T02:31:42Z
Last-Modified: 2023-05-25T12:11:23Z
dcterms:modified: 2023-05-25T12:11:23Z
title: Ion microscopy with evolutionary-algorithm-based autofocusing
xmpMM:DocumentID: uuid:a314e1d3-b406-4c93-a73b-5c98c8ca129f
Last-Save-Date: 2023-05-25T12:11:23Z
CrossMarkDomains[1]: iop.org
pdf:docinfo:keywords: strong-field ionization; ion microscopy; evolutionary algorithms
pdf:docinfo:modified: 2023-05-25T12:11:23Z
meta:save-date: 2023-05-25T12:11:23Z
Content-Type: application/pdf
X-Parsed-By: org.apache.tika.parser.DefaultParser
dc:subject: strong-field ionization; ion microscopy; evolutionary algorithms
access_permission:assemble_document: true
xmpTPg:NPages: 9
pdf:charsPerPage: 723
access_permission:extract_content: true
access_permission:can_print: true
meta:keyword: strong-field ionization; ion microscopy; evolutionary algorithms
access_permission:can_modify: true
pdf:docinfo:created: 2023-01-26T02:31:42Z