Modulated illumination microscopy: Application perspectives in nuclear 
nanostructure analysis

Cremer, Christoph; Schock, Florian; Failla, Antonio Virgilio; Birk, Udo

doi:10.1111/jmi.13297

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Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis

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Cremer, Christoph
Kirchhoff Institute for Physics (KIP), Heidelberg, Germany;
Interdisciplinary Centre for Scientific Computing (IWR), University of Heidelberg, Heidelberg, Germany;
Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society;

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Cremer, C., Schock, F., Failla, A. V., & Birk, U. (2024). Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis. Journal of Microscopy. doi:10.1111/jmi.13297.

Cite as: https://hdl.handle.net/21.11116/0000-000F-395B-C

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