Jang, K., Ko, W.-S., Son, J.-H., Jang, J.-I., Kim, B., Vega-Paredes, M., et al. (2024). Impact of Hierarchical Dopant-Induced Microstructure on Thermoelectric Properties of p-Type Si–Ge Alloys Revealed by Comprehensive Multi-Scale Characterization. Advanced Functional Materials, 34(40): 2403785. doi:10.1002/adfm.202403785.