date: 2011-01-05T14:56:22Z
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pdf:docinfo:title: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
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Keywords: aluminum oxide charge state contact potential defects domain boundaries dynamic force microscopy frequency modulation atomic force microscopy Kelvin probe force microscopy magnesium oxide non-contact atomic force microscopy scanning tunneling microscopy thin films work function
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subject: aluminum oxide charge state contact potential defects domain boundaries dynamic force microscopy frequency modulation atomic force microscopy Kelvin probe force microscopy magnesium oxide non-contact atomic force microscopy scanning tunneling microscopy thin films work function
dc:creator: Thomas König, Georg H Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
dcterms:created: 2011-01-03T10:48:06Z
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title: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
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pdf:docinfo:keywords: aluminum oxide charge state contact potential defects domain boundaries dynamic force microscopy frequency modulation atomic force microscopy Kelvin probe force microscopy magnesium oxide non-contact atomic force microscopy scanning tunneling microscopy thin films work function
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dc:title: Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
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pdf:docinfo:creator: Thomas König, Georg H Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
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creator: Thomas König, Georg H Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
meta:author: Thomas König, Georg H Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
dc:subject: aluminum oxide charge state contact potential defects domain boundaries dynamic force microscopy frequency modulation atomic force microscopy Kelvin probe force microscopy magnesium oxide non-contact atomic force microscopy scanning tunneling microscopy thin films work function
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meta:keyword: aluminum oxide charge state contact potential defects domain boundaries dynamic force microscopy frequency modulation atomic force microscopy Kelvin probe force microscopy magnesium oxide non-contact atomic force microscopy scanning tunneling microscopy thin films work function
Author: Thomas König, Georg H Simon, Lars Heinke, Leonid Lichtenstein, Markus Heyde
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