--f02f6326863e053ec2e5d51539dbeb70 Content-Disposition: form-data; name="data"; filename="10.1016_j.scriptamat.2023.115515.pdf" https://api.elsevier.com/content/article/pii/S1359646223002397doi:10.1016/j.scriptamat.2023.1155151-s2.0-S135964622300239710.1016/j.scriptamat.2023.115515S1359-6462(23)00239-7Effect of Si on the hydrogen-based direct reduction of Fe2O3 studied by XPS of sputter-deposited thin-film model systems Scripta MaterialiaJournal135964622023-08-31August 20231trueFullfalseEuropean Research CouncilFundingBodyhttp://creativecommons.org/licenses/by-nc-nd/4.0/ --f02f6326863e053ec2e5d51539dbeb70--