A correlative EBSD, EBIC and APT study of grain boundary segregation in 
multicrystalline silicon

Stoffers, Andreas; Cojocaru-Mirédin, Oana; Seifert, Winfried; Zaefferer, Stefan; Raabe, Dierk

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A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon

Stoffers, A., Cojocaru-Mirédin, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Talk presented at Atom Probe Tomography & Microscopy 2014. Stuttgart, Germany. 2014-08-31 - 2014-09-05.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DC85-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-DC86-2

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Creators:
Stoffers, Andreas¹, Author
Cojocaru-Mirédin, Oana¹, Author
Seifert, Winfried², Author
Zaefferer, Stefan³, Author
Raabe, Dierk⁴, Author

Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
2Joint Lab IHP/BTU, Cottbus, Germany, ou_persistent22
3Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
4Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Dates: Created: 2014

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Title: Atom Probe Tomography & Microscopy 2014

Place of Event: Stuttgart, Germany

Start-/End Date: 2014-08-31 - 2014-09-05

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