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  Self-testing and self-checking combinational circuits with weakly independent outputs

Sogomonjan, E. S., & Goessel, M.(1992). Self-testing and self-checking combinational circuits with weakly independent outputs (MPI-I-92-601). Saarbrücken: Max-Planck-Institut für Informatik.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-B734-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-E372-6
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Sogomonjan, E. S.1, Author
Goessel, M1, Author
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 Abstract: In this paper we propose a structure dependent method for the systematic design of self--checking error detection circuits wich is well adapted to the technical fault model considered. For online detection, the hardware is in normal operation mode, and for testing in test mode. In the test mode, these error detection circuits guarantee a 100\% fault coverage for single stuck-at-0/1 faults and a high fault coverage for arbitrary faults.

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Language(s): eng - English
 Dates: 1992
 Publication Status: Issued
 Pages: 18 p.
 Publishing info: Saarbrücken : Max-Planck-Institut für Informatik
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 Identifiers: Report Nr.: MPI-I-92-601
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Title: Research Report
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