New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion 
in Naturally Deformed Minerals

Dubosq, Renelle; Gault, Baptiste; Rogowitz, Anna; Schweinar, Kevin; Zaefferer, Stefan; Schneider, David

doi:10.1017/S1431927619013229

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New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals

Dubosq, R., Gault, B., Rogowitz, A., Schweinar, K., Zaefferer, S., & Schneider, D. (2019). New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals. Microscopy and Microanalysis, 25(S2), 2498-2499. doi:10.1017/S1431927619013229.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-A0FB-C Version Permalink: https://hdl.handle.net/21.11116/0000-0004-A0FF-8

Genre: Journal Article

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Creators:
Dubosq, Renelle¹, Author
Gault, Baptiste^{2, 3}, Author
Rogowitz, Anna⁴, Author
Schweinar, Kevin², Author
Zaefferer, Stefan⁵, Author
Schneider, David¹, Author

Affiliations:
1Department of Earth and Environmental Sciences, University of Ottawa, Ottawa, Canada, ou_persistent22
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Department of Materials, Royal School of Mines, Imperial College London, London, UK, ou_persistent22
4Department of Geodynamics and Sedimentology, University of Vienna, Vienna, Austria, ou_persistent22
5Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Published Online: 2019-08-05Date issued: 2019-08

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1017/S1431927619013229

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Title: Microscopy and Microanalysis

Abbreviation : Microsc. Microanal.

Source Genre: Journal

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Pages: - Volume / Issue: 25 (S2) Sequence Number: - Start / End Page: 2498 - 2499 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414