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  Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments

Grundmeier, G., Wapner, K., Schönberger, B., & Stratmann, M. (2004). Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments. Talk presented at ISE Conference, 55th Annual Meeting. Thessaloniki, Greece. 2004-09-19 - 2004-09-24.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-640F-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6411-8
Genre: Talk

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 Creators:
Grundmeier, G.1, 2, Author           
Wapner, K.1, Author           
Schönberger, B.3, Author           
Stratmann, M.3, Author           
Affiliations:
1Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349              
2Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              
3Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 288666
 Degree: -

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Title: ISE Conference, 55th Annual Meeting
Place of Event: Thessaloniki, Greece
Start-/End Date: 2004-09-19 - 2004-09-24

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