On the Multiple Event Detection in Atom Probe Tomography

Peng, Zirong; Gault, Baptiste; Raabe, Dierk; Ashton, Michael W.; Sinnott, Susan B.; Choi, Pyuck-Pa; Li, Yujiao

doi:10.1017/S1431927617003762

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On the Multiple Event Detection in Atom Probe Tomography

Peng, Z., Gault, B., Raabe, D., Ashton, M. W., Sinnott, S. B., Choi, P.-P., et al. (2017). On the Multiple Event Detection in Atom Probe Tomography. In MicroscopyMicroanalysis (pp. 618-619). doi:10.1017/S1431927617003762.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-0630-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-08C1-4

Genre: Conference Paper

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Creators:
Peng, Zirong¹, Author
Gault, Baptiste², Author
Raabe, Dierk¹, Author
Ashton, Michael W.³, Author
Sinnott, Susan B.⁴, Author
Choi, Pyuck-Pa⁵, Author
Li, Yujiao⁶, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Department of Materials science and Engineering, University of Florida, Gainesville, FL 32611-6400, USA, ou_persistent22
4Materials Science and Engineering, Pennsylvania State University, State College, PA 16802, USA, ou_persistent22
5Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22
6Center for Interface-Dominated High Performance Materials, Ruhr-Universität Bochum, Bochum 44780, Germany, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2017-08-04Date issued: 2017

Publication Status: Issued

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Identifiers: DOI: 10.1017/S1431927617003762

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Title: Microscopy & Microanalysis 2017

Place of Event: St. Louis, MO, USA

Start-/End Date: 2017-08-06 - 2017-08-10

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Title: MicroscopyMicroanalysis

Source Genre: Proceedings

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Pages: - Volume / Issue: 23 (S1) Sequence Number: - Start / End Page: 618 - 619 Identifier: -