Marx, V. M., Cordill, M. J., Kirchlechner, C., & Dehm, G. (2014). In-situ stress measurements in thin films using synchrotron diffraction. Talk presented at Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen. Ellwangen, Germany. 2014-10-05 - 2014-10-08.