ausblenden:
Schlagwörter:
Test sample; Semiconductor heterostructure; Nanowhisker; Submicron beam spot sizes; Submicron beam spot shape
Zusammenfassung:
For the precise determination of the sizes of submicron beam spots test structures with an excellent edge definition are required. For this purpose a semiconductor heterostructure consisting of an 1.62 @mm GaInP epi--layer grown on (001)...