In-situ TEM tensile testing of thin Au films: A transition in deformation 
mechanism

Oh, Sang Ho; Kiener, Daniel; Legros, Marc; Gruber, Patric Alfons; Arzt, Eduard; Dehm, Gerhard

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In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism

Oh, S. H., Kiener, D., Legros, M., Gruber, P. A., Arzt, E., & Dehm, G. (2006). In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-51BE-7 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-51BF-5

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Urheber:
Oh, Sang Ho¹, Autor
Kiener, Daniel², Autor
Legros, Marc³, Autor
Gruber, Patric Alfons⁴, Autor
Arzt, Eduard⁴, Autor
Dehm, Gerhard⁵, Autor

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Austria, ou_persistent22
3CEMES-CNRS, 29 rue J. Marvig, 31055 Toulouse, France, ou_persistent22
4Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
5Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22