Pfanner, G., Freysoldt, C., Neugebauer, J., & Gerstmann, U. (2012). Ab initio EPR parameters for dangling-bond defect complexes in silicon: Effect of Jahn-Teller distortion. Physical Review B, 85(19): 195202, pp. 1-8. doi:10.1103/PhysRevB.85.195202.