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  Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

König, T., Simon, G. H., Heinke, L., Lichtenstein, L., & Heyde, M. (2011). Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy. Beilstein Journal of Nanotechnology, 2, 1-14. doi:10.3762/bjnano.2.1.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-425E-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-27F8-8
Genre: Journal Article

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2190-4286-2-1.pdf (Publisher version), 7MB
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https://hdl.handle.net/11858/00-001M-0000-002B-27F7-A
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2190-4286-2-1.pdf
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Copyright Date:
2011
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© 2011 König et al; licensee Beilstein-Institut.
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http://creativecommons.org/licenses/by/2.0/

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 Creators:
König, Thomas1, Author           
Simon, Georg Hermann1, Author           
Heinke, Lars1, Author           
Lichtenstein, Leonid1, Author           
Heyde, Markus1, Author           
Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, Berlin, DE, ou_24022              

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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: 14
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.3762/bjnano.2.1
 Degree: -

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Title: Beilstein Journal of Nanotechnology
Source Genre: Journal
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Publ. Info: Frankfurt, Germany : Beilstein-Institut
Pages: 14 Volume / Issue: 2 Sequence Number: - Start / End Page: 1 - 14 Identifier: ISSN: 2190-4286