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  Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., et al. (2003). Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces. Langmuir, 19(7), 3056-3061. doi:10.1021/la026693+.

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 Creators:
Lorenz-Haas, C.1, Author           
Müller-Buschbaum, P., Author
Wunnicke, O., Author
Cassignol, C.1, Author           
Burghammer, M., Author
Riekel, C., Author
Stamm, Manfred2, Author           
Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545              
2Inst Polymerforsch Dresden EV, D-01069 Dresden, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2003-04-01
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 28375
ISI: 000181980900074
Other: P-03-293
DOI: 10.1021/la026693+
 Degree: -

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Title: Langmuir
Source Genre: Journal
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Publ. Info: Columbus, OH : American Chemical Society
Pages: - Volume / Issue: 19 (7) Sequence Number: - Start / End Page: 3056 - 3061 Identifier: ISSN: 0743-7463
CoNE: https://pure.mpg.de/cone/journals/resource/954925541194